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| CORRECTIONAL FORMULAE FOR X-RAY PROFILE GEOMETRIC BROADENING IN MEASUREMENT OF MOSAIC SIZE AND LATTICE DISTORTION |
| BAI Aimin; HE Chongzhi (Central Iron and Steel Research Institute; Ministry of Metallurgical Industry; Beijing) (Manuscript received 26 November; 1983) |
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Cite this article:
BAI Aimin; HE Chongzhi (Central Iron and Steel Research Institute; Ministry of Metallurgical Industry; Beijing) (Manuscript received 26 November; 1983). CORRECTIONAL FORMULAE FOR X-RAY PROFILE GEOMETRIC BROADENING IN MEASUREMENT OF MOSAIC SIZE AND LATTICE DISTORTION. Acta Metall Sin, 1984, 20(6): 471-474.
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Abstract The optimization method was employed to study the corrections to the geometric broadening of X-ray profile in the measurement of the mosaic size and the lattice distortion using the integral line-breadth. It was found that among the nine possible match groups of the physical broadening function, f(x), with the geometric broadening function, g(x), the correctional formulae for the geometric broadening of five outstanding ones, i. e. G-C, C-G, G-CC, CC-G or CC-CC, were improved with more simplicity, high accuracy and easy on-line applicability.
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Received: 18 June 1984
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2 Klug, H. P.; Alexander, L. E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p.618．
3 Jones, F. W., Proc. R. Soc., London, 166A (1938) , 16．
4 Powell, M. J. D., Computer J., 7 (1964) , 155． |
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