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Acta Metall Sin  1980, Vol. 16 Issue (3): 362-383    DOI:
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ELECTROMIGRATION PHENOMENON IN TUNGSTEN
Wu Yunzhong Shanghai Institute of Metallurgy; Academia Sinica
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Wu Yunzhong Shanghai Institute of Metallurgy; Academia Sinica. ELECTROMIGRATION PHENOMENON IN TUNGSTEN. Acta Metall Sin, 1980, 16(3): 362-383.

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Abstract  Hairpin tungsten filaments showed premature failure in conducting directcurrent. The cause of this failure was interpreted as the superposition of theelectromigration and the Soret effect. An effective method has been proposed toimprove the life-time of the filament.
Received:  18 March 1980     
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