[1] Ziebold, T. O. and Ogilvei, R. E., Anal. Chem 36 (1964) , 322．
[2] Ingersoll, R. M., Taylor, J. E. and Derouin, D. H., Advances in X-Ray Analysis, vol. 9, Plenum, New York, 1965, p. 273．
[3] Albee, A. L. and Ray, L., Analy. Chem., 42 (1970) , 1408．
[4] Bence, A. C. and Albee, A. L., J. Geol., 76 (1968) , 382．
[5] 金属研究所,金属材料研究,1976,№ 7, p. 452．
[6] Toshio Shiraiwa and Nobukatsu Fujine, Jap. J. Appl. Phys., 9 (1970) , 976．
[7] Heinrich, K. F. J., The Electron Microprobe, ed. by T.D. McKinley et al., Wiley, New York, 1966, p, 296． |
