金属学报  1983, Vol. 19 Issue (4): 131-136

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修正理论计算参考强度比值的X射线定量相分析

陆金生;邸秀萱

冶金工业部钢铁研究总院;冶金工业部有色金属研究总院

MODIFICATION OF CALCULATED REFERENCE INTENSITY RATIO FOR X-RAY QUANTI-TATIVE PHASE ANALYSIS

by LU Jinsheng (Central Iron and Steel Research Institute; Minstry of Metallurgical Industry; Beijing); DI Xiuxuan (General Research Institute of Non-Ferrous Metals; Ministry of Metallurgical Industry; Beijing) (Manuscript received 30 March; 1982; revised manuscript 4 November; 1982)

陆金生;邸秀萱. 修正理论计算参考强度比值的X射线定量相分析[J]. 金属学报, 1983, 19(4): 131-136.
, . MODIFICATION OF CALCULATED REFERENCE INTENSITY RATIO FOR X-RAY QUANTI-TATIVE PHASE ANALYSIS[J]. Acta Metall Sin, 1983, 19(4): 131-136.

摘要 参考文献 相关文章 Metrics 全文: PDF(460 KB)   摘要: 本文介绍了一种新的X射线定量相分析方法,即首先计算出参考强度比值。再模拟样品的真实物理状态和试验条件对计算值进行修正(包括显微吸收、择尤取向、单色器和自动发散狭缝等)。用此修正值作X射线定量相分析时,可以显著提高分析结果的准确度。 只要知道物相有关的晶体结构参数,就可以用本方法完成各种样品的定量分析,还可以检验实际测量的参考强度比值的准确度及解析误差来源。 Abstract：An improved method for the quantitative X-ray phase analysis is developed. The reference intensity ratio is first calculated theoretically, then modified by the analogue specimens with the true physical state and the testing conditions including microabsorption, preferred orientation, monochromator and automatic divergence slit. Thus, its accuracy can be much improved. Result of experiment showed that this modification is available for those samples which are hard to analyse by conventional method if their crystalline structure parameters associated with the phase are given. It may be also used to verify the accuracy of the reference intensity ratio measurement and to judge by what reason the error caused. 收稿日期: 1983-04-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 陆金生 邸秀萱 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1983/V19/I4/131 1 Hubbard, C. R.; Evans, E. H,; Smith, D. K., J. Appl. Crystallogr., 9 (1976) , 169． 2 Chung, F. H.; ibid., 7 (1974) , 519, 526． 3 Klug, H. P.; Alexander, L. E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p.365． 4 Hubbard, C. R.; Smith, D. K., Advances in X-Ray Analysis, Vol.20 Proc. 25th Annual Conf., Denver, Aug. 1976, Eds. McMurdie, H. F.; et al., Plenum, New York, 1977, p.27． 5 刘沃恒,物理,8(1979) ,224． 6 Zevin, L. S., J. Appl. Crystallogr., 10 (1977) , 147． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed