金属学报  1982, Vol. 18 Issue (4): 493-500

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X射线回摆法测定应力的计算方法

王仁智

航空材料研究所

CALCULATION OF STRESS MEASUREMENT BY X-RAY OSCILLATION METHOD

Wang Renzhi (Institute of Aeronautical Materials; Beijing) (Manuscript received 19 January; 1981; revised manuscript 23 May; 1981)

王仁智. X射线回摆法测定应力的计算方法[J]. 金属学报, 1982, 18(4): 493-500.
. CALCULATION OF STRESS MEASUREMENT BY X-RAY OSCILLATION METHOD[J]. Acta Metall Sin, 1982, 18(4): 493-500.

摘要 参考文献 相关文章 Metrics 全文: PDF(490 KB)   摘要: 通常采用回摆法来解决大晶粒材料给X射线应力测定所带来的困难,但是这首先需要解决应力的计算方法。本文提出了X射线回摆法在各种条件下的应力计算公式。结果表明,应用这些公式计算的结果与用常规法获得的计算结果基本一致。 Abstract：For the purpose of the residual stress determination of the materials with coarser grains such as most of Al alloys and Ni-base alloys using X-ray oscillation method, the formulae for the stress calculation have been proposed. It was resulted that the calculated values obtained are fairly consistent with those by conventional X-ray stress measuring methob of fixed ψ_0 angle. 收稿日期: 1982-04-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 王仁智 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1982/V18/I4/493 1 知久健夫;青山咸恒;并川宏彦;飒田耕三;岩久省吾;多田雅昭,材料,19(1970) , №.207,1028． 2 李仁文,无损检测,(1979) ,№4,40;№5,41． 3 白岩俊男;阪本喜保,X射线应力测定标准方法,附录五,日本材料学会颁发,第一机械工业部机械研究院机电研究所译,1976,p.19．i No related articles found! Viewed Full text Abstract Cited   Shared      Discussed