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COMBINATION ALGORITHM FOR CURVE FITTING OF XPS DATA AND DETECTION |
GONG Yandong(Institute of Metal Research; Chinese Academy of Sciences;Shenyang 110015)(Manuscript received 1995-06-12) |
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Cite this article:
GONG Yandong(Institute of Metal Research; Chinese Academy of Sciences;Shenyang 110015)(Manuscript received 1995-06-12). COMBINATION ALGORITHM FOR CURVE FITTING OF XPS DATA AND DETECTION. Acta Metall Sin, 1996, 32(2): 219-224.
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Abstract A new line shape was chosen for curve fitting of XPS (X-ray photoelectron spectroscopy) data. In general. the GLP(Gauss-Lorentz product function) orGLS(Gauss-Lorentz sum function) was used as the line shape of XPS, but they are not strict because the true line shape is a convolution of many comments. A convoluted line shape is chosen in fitting procedure. The new algorithm is called ‘combination algorithm' . A detec tion was taken with Cu 3p spectrum and O ls spectra of Fe-Mn-Al alloy. It is shown that the combination algorithm is more effective for the process of XPS data than GLP and GLS.(Correspondent: GONG Yandong, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110015)
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Received: 18 February 1996
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1SherwoodPMA.PracticalSurfaceAnalysis,2nded.,Chechester:JohnWileyandSons,1990;1:5552SherwoodPMA.PracticalSurfaceAnalysisbyAugerandX-ray,photoelectronSpectroscopy,Chechester:JohnWileyandSons,1983:4453ShirleyDA.PhysRev,1972;B5:4709 |
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