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| "SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY |
| Wu Qixing;Qin Daoxiong Research Institute of Daye Steet Works |
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Cite this article:
Wu Qixing;Qin Daoxiong Research Institute of Daye Steet Works. "SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY. Acta Metall Sin, 1979, 15(2): 274-314.
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Abstract X-ray identification of certain superfine grains weighing 0.003μg each hasbeen carried out by means of "single grain" oscillating crystal method in an ordi-nary Debye-Scherrer camera. The principle of this method, the measurement andthe calculation of the diffraction angles, the number of diffraction spots and theirrelative intensities in reference to the relevant ASTM cards are discussed in detail.Attempts have also been made to revealing the presence of certain rare earth inclu-sions by this method as well as to further verifying the proposed formula.
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Received: 18 February 1979
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[1] Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p. 243．
[2] Cunningham, B. B., Submicrogram Experimentation, Interscience, New York, 1960, p. 69．
[3] 31 (1965) , ?????????p. 148．
[4] Guinier,A.,X射线晶体学,施士元译,科学出版社,1959年,p.148． |
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