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Acta Metall Sin  1980, Vol. 16 Issue (3): 308-373    DOI:
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AN INVESTIGATION ON THE VAPOUR PHASE EPITAXY OF DOPED GaAs
Peng Ruiwu;Sun Shangzhu;Shen Songhua Shanghai Institute of Metallurgy; Academia Sinica
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Peng Ruiwu;Sun Shangzhu;Shen Songhua Shanghai Institute of Metallurgy; Academia Sinica. AN INVESTIGATION ON THE VAPOUR PHASE EPITAXY OF DOPED GaAs. Acta Metall Sin, 1980, 16(3): 308-373.

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Abstract  Epitaxial layers of doped GaAs have been prepared from a Ga/AsCl_3/H_2 systemin an improved epitaxial apparatus and the vapour-phase doping process of the GaAshas been investigated. The quality of these layers thus obtained was found to besatisfactory and they are used in making microwave devices such as variators andswitches. Discussions on a variety of factors including surface morphology, growthrate, electronic mobility, breakdown voltage, doping uniformity across a wafer,doping profile, defects and reproducibility of the epitaxy were made.
Received:  18 March 1980     
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