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| AN X-RAY DOUBLE DIFFRACTION LINE METHOD FOR MEASURING COMPOSITION OF CUBIC CRYSTAL SYSTEM SOLID SOLUTION |
| Yang Chuanzheng and Jiang Xiaolong (Shanghai Institute of Metallurgy; Academia Sinica) |
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Cite this article:
Yang Chuanzheng and Jiang Xiaolong (Shanghai Institute of Metallurgy; Academia Sinica). AN X-RAY DOUBLE DIFFRACTION LINE METHOD FOR MEASURING COMPOSITION OF CUBIC CRYSTAL SYSTEM SOLID SOLUTION. Acta Metall Sin, 1981, 17(2): 196-205.
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Abstract The composition of a continuous or a limited solid solution obeyed the Vegard theorem were successfully measured by two diffraction lines with single or double wavelength of X-ray. The relationship between the composition, x, and the diffraction angle difference, δ_x, for cubic crystal system may be deduced as:x≈(δ_x-δ_0)/(δ_1-δ_0) where δ_0, δ_1 and δ_x are the differences between two diffraction angles for x=0, 1 and x respectively. Certain typical examples were used to check the formula. In case of deviating from the linear relation, a correct term, Δ_x, was introduced into it, and Δx vs x plot was found to satisfy a parabolical equation. Thus, the formula may be modified as:x=(δ_x-δ_0)/(δ_1-δ_0)+Δx_(max)4(δ_x-δ_0)(δ_1-δ_x)/(δ_1-δ_0)~2 where Δx_(max) is the deviation at x=0.5, it eliminates the error induced from the linear approximation. Finally, the error of these two methods was discussed briefly. Because these methods depend only on the difference between diffraction angles, the error due to incorrect zero-position and specimen eccentricity can be eliminated, therefore, the methods seem to be simple and rapid, and to have proper applicability as well.
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Received: 18 February 1981
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[2] Popovic, S., J. Appl. Cryst., 4 (1971) , 240．
[3] Popovic, S., J. Appl. Cryst., 6 (1973) , 122．
[4] #12 |
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