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MODIFICATION OF CALCULATED REFERENCE INTENSITY RATIO FOR X-RAY QUANTI-TATIVE PHASE ANALYSIS |
by LU Jinsheng (Central Iron and Steel Research Institute; Minstry of Metallurgical Industry; Beijing); DI Xiuxuan (General Research Institute of Non-Ferrous Metals; Ministry of Metallurgical Industry; Beijing) (Manuscript received 30 March; 1982; revised manuscript 4 November; 1982) |
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Cite this article:
by LU Jinsheng (Central Iron and Steel Research Institute; Minstry of Metallurgical Industry; Beijing); DI Xiuxuan (General Research Institute of Non-Ferrous Metals; Ministry of Metallurgical Industry; Beijing) (Manuscript received 30 March; 1982; revised manuscript 4 November; 1982). MODIFICATION OF CALCULATED REFERENCE INTENSITY RATIO FOR X-RAY QUANTI-TATIVE PHASE ANALYSIS. Acta Metall Sin, 1983, 19(4): 131-136.
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Abstract An improved method for the quantitative X-ray phase analysis is developed. The reference intensity ratio is first calculated theoretically, then modified by the analogue specimens with the true physical state and the testing conditions including microabsorption, preferred orientation, monochromator and automatic divergence slit. Thus, its accuracy can be much improved. Result of experiment showed that this modification is available for those samples which are hard to analyse by conventional method if their crystalline structure parameters associated with the phase are given. It may be also used to verify the accuracy of the reference intensity ratio measurement and to judge by what reason the error caused.
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Received: 18 April 1983
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1 Hubbard, C. R.; Evans, E. H,; Smith, D. K., J. Appl. Crystallogr., 9 (1976) , 169. 2 Chung, F. H.; ibid., 7 (1974) , 519, 526. 3 Klug, H. P.; Alexander, L. E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p.365. 4 Hubbard, C. R.; Smith, D. K., Advances in X-Ray Analysis, Vol.20 Proc. 25th Annual Conf., Denver, Aug. 1976, Eds. McMurdie, H. F.; et al., Plenum, New York, 1977, p.27. 5 刘沃恒,物理,8(1979) ,224. 6 Zevin, L. S., J. Appl. Crystallogr., 10 (1977) , 147. |
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