Acta Metall Sin  1983, Vol. 19 Issue (6): 104-110    DOI:

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OBSERVATION OF CRYSTALLOGRAPHIC CONTRAST ON POLYCRYSTALLINE SPECIMENS BY MEANS OF CHANNELLING MICROGRAPHY TECHNIQUE

LAN Fenlan; LIAO Qianchu; WANG Hongjun; WANG Yun (Central Iron and Steel Research Institute; Ministry of Metallurgical Industry; Beijing)

LAN Fenlan; LIAO Qianchu; WANG Hongjun; WANG Yun (Central Iron and Steel Research Institute; Ministry of Metallurgical Industry; Beijing). OBSERVATION OF CRYSTALLOGRAPHIC CONTRAST ON POLYCRYSTALLINE SPECIMENS BY MEANS OF CHANNELLING MICROGRAPHY TECHNIQUE. Acta Metall Sin, 1983, 19(6): 104-110.

Abstract References Related Articles Recommended Metrics Download:  PDF(1254KB)  Export:  BibTeX | EndNote (RIS)       Abstract  In order to reveal the crystallographic contrast from the surface of the polycrystalline specimen, two electron optical paths were analyzed. For the standard scanning path, the magnification of the channelling micrograph is controlled by the electron beam scanning angular field. The ratio between geometric and crystallographic contrast can be modulated by the signal processing method. For the defocused beam rocking path, the magnification is controlled by the defocused distance. The anomalous effects of the orientation contrast resulted by the deformed specimen may be interpreted by means of ECP superimposed on the channelling photograph.Observations were made of certain specimens such as W, Mo and 304 austenitic stainless steel. It seems that the present technique is available for study of both the orientation distribution and the deformation behaviour of the polycrystalline materials. Received:  18 June 1983      Service E-mail this article Add to citation manager E-mail Alert RSS （） Articles by authors URL:  https://www.ams.org.cn/EN/     OR     https://www.ams.org.cn/EN/Y1983/V19/I6/104 1 Booker, G. R., Scanning Electron Microscopy, 1971, Proc. of 4th Annual SEM Symposium, Eds. Johari, O.; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illinois, USA, 1971, p. 467． 2 Stickler, R.; Hughes, C. W., ibid., p. 473． 3 Joy, D. C.; Newbury, D. E.; Hazzledine, P. M., Scanning Electron Microscopy, 1972, Proc. of 5th Annual SEM Symposium, Eds. Johari, O.; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illionis, USA, 1972, p. 97． 4 Hirsch, P. B.; Humphreys, C. J., Scanning Electron Microscopy, 1969, Proc. of 2nd Annual SEM Symposium, Eds. Johari, O; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illinois. USA, 1969, p. 451． 5 蓝芬兰,廖乾初,金属学报,16 (1980) ,104． No related articles found! No Suggested Reading articles found! Viewed Full text Abstract Cited   Shared      Discussed