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| COMPARISON OF TWO FUNCTIONS FOR X-RAY DIFFRACTION FITTING |
| by ZHANG Zhikun;CUI Xiangxu; WANG Yuming (Jilin University; changchun) (Manuscript received 11 May; 1985; revised manuscript 28 April; 1986) |
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Cite this article:
by ZHANG Zhikun;CUI Xiangxu; WANG Yuming (Jilin University; changchun) (Manuscript received 11 May; 1985; revised manuscript 28 April; 1986). COMPARISON OF TWO FUNCTIONS FOR X-RAY DIFFRACTION FITTING. Acta Metall Sin, 1987, 23(4): 389-392.
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Abstract X-ray diffraction fitting of the profiles for P-implanted monocrystalline Si was performed by means of Pearson Ⅶ and Pseudo-Voigt functions.It was found that the exactitude of the latter is better than the former.However, the former can be used to calculate the parameters easily.The correlation between 2ω/β and Pearson Ⅶ parameters m and a was presented and applied to phase analysis of SiO_2-SnO_2 mixture.
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Received: 18 April 1987
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1 Keijser Th H De, Mittemeijer E J, Rozendaal H C F. J Appl Crystallogr, 1983; 16: 309-316
2 Keijser Th H De, Langford J I, Mittemeijer E J, Vogels A B P. J Appl Crystallogr 1982; 15:308-314
3 Alexander L, Klug H P. Anal Chem, 1948 20:886-889
4 Naidu S V N, Houska C R. J Appl Crystallogr, 1980; 15:190-19 |
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