Acta Metall Sin  1990, Vol. 26 Issue (2): 74-78    DOI:

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MEASUREMENT OF VACANCY MIGRATION ENERGY BY ELECTRON IRRADIATION

WAN Farong;XIAO Jimei;YUAN Yi University of Science and Technology Beijing lecturer;Department of Material Physics;University of Science and Technology Beijing; Beijing 100083

WAN Farong;XIAO Jimei;YUAN Yi University of Science and Technology Beijing lecturer;Department of Material Physics;University of Science and Technology Beijing; Beijing 100083. MEASUREMENT OF VACANCY MIGRATION ENERGY BY ELECTRON IRRADIATION. Acta Metall Sin, 1990, 26(2): 74-78.

Abstract References Related Articles Recommended Metrics Download:  PDF(330KB)  Export:  BibTeX | EndNote (RIS)       Abstract  A method together with a new formula were developed for measur-ing the vacancy migration energy by HVEM considering the effect of surface sinkof specimen on point defects. The vacancy migration energy may be calculatedthrough the loop growth rate under electron irradiation at various temperatures. Key words:  electron irradiation damage      vacancy migration energy      interstitial loop      Received:  18 February 1990      Service E-mail this article Add to citation manager E-mail Alert RSS （） Articles by authors URL:  https://www.ams.org.cn/EN/     OR     https://www.ams.org.cn/EN/Y1990/V26/I2/74 1 Kiritani M, Takata H, Moriyama K, Fujita F E. Philos Mag, 1979; 40A: 779--802 2 Kiritani M. In: Takamura J, Doyama M, Kiritani M eds., Point Defects and Defect Interactions in Metals, Tokyo: Tokyo University, 1982: 59--66 3 Phillipp F, Saile B, Urban K. In: Takamura J, Doyama M, Kiritani M eds., Point Defects and Defect Interactions in Metals, Tokyo: Tokyo, University 1982: 261--264 4 Takahashi H, Urban K. In: Takamura J, Doyama M, Kiritani M eds., Point Defects and Defect Interactions in Metals, Tokyo: Tokyo University, 1982: 346--348 [1] QIAO Yonghong; WANG Shaoqing. Molecular dynamics studies on vacancy movement in crystalline silicon[J]. 金属学报, 2005, 41(3): 231-234 . No Suggested Reading articles found! Viewed Full text Abstract Cited   Shared      Discussed