研究了在pH值分别为8, 9和10的除氧硼酸缓冲溶液中, 低碳钢腐蚀产物对其活化/钝化敏感性的影响. 实验结果表明, 在pH值为8时, 低碳钢一直处于活性溶解状态, 不受腐蚀产物影响; 在pH值为9和10时, 表面腐蚀产物使低碳钢钝化, 其腐蚀电位最后稳定于钝化区间. XPS和XRD等分析结果表明, 腐蚀产物由Fe6(OH)12B4O7和γ-FeOOH组成. 腐蚀产物覆盖的低碳钢比裸低碳钢更容易发生钝化.
Low carbon steel has been studied as one candidate material of the outer container used in the geological disposal of the high-level radioactive nuclear waste. The active/passive state of the steel is the most important factor in maintaining the service life of the container. The active state will ensure that the container achieve the designed life under general corrosion, and moreover, the passive state will degrade the container's life under stress corrosion cracking (SCC) caused by pitting corrosion. In the groundwater, a lot of chemical compositions have very complicated effects on the active/passive state of the low carbon steel. Among these factors, obviously, the pH values of the ground water and the corrosion products of the low carbon steel would be the most important factors. In this paper, the influences of pH values and corrosion products on the susceptibility of the low carbon steel in the deaerated borate buffer solutions were studied. The results showed that the corrosion product did not change the corrosion potential of the low carbon steel at a pH value of 8, which means that the steel was in the active state, while the corrosion product made the corrosion potentials of low carbon steel move to the passive state at pH values of 9 and 10. XPS and XRD analyses indicated that the corrosion products were composed of Fe6(OH)12B4O7 and γ-FeOOH. The low carbon steel with corrosion products was passivated more easily than the naked steel substrate.
[1] Wersin P, Spahiu K, Bruno J. SKB Technical Report (94–02), Stockholm: Swedish Nuclear Fule and Waste Management Co., 1994
[2] Wang G, Chen J M. J Chin Soc Corros Prot, 1985; 5: 258
(王戈, 陈俊明. 中国腐蚀与防护学报, 1985; 5: 258)
[3] Zhang Q C, Wu J S. Mater Rev, 2000; 14: 12
(张全成, 吴建生. 材料导报, 2000; 14: 12)
[4] Almeida E, Morcillo M, Rosales B M, Marrocos M. Mater Corros, 2000; 51: 859
[5] Bonin P M L, Jedral W, Odziemkowski M S, Gillham R W. Corros Sci, 2000; 42: 1921
[6] Ateya B G, Al Kharafi F M, Abdalla R M. Mater Chem Phys, 2002; 78: 534
[7] Ahn S J, Kwon H S. Electrochim Acta, 2004; 49: 3347
[8] Hamadou L, Kadri A, Benbrahim N. Appl Surf Sci, 2005; 252: 1510
[9] Harrington S P, Wang F. Electrochim Acta, 2010; 55: 4092
[10] Nagayama M, Cohen M. J Electrochem Soc, 1962; 109: 781
[11] Markovac V, Cohen M. J Electrochem Soc, 1967; 114: 678
[12] Tokunaga K. Jpn J Appl Phys, 1982; 21: 1700
[13] Brion D. Appl Surf Sci, 1980; 5: 133
[14] Moulder J F, Stickle W F, Sobol P E, Bomben K D. Handbook of X–ray Photoelectron Spectroscopy. Waltham: Perkin–Elmer Corporation, 1979: 36
[15] Schreifels J A, Maybury P C, Swartz W E. J Catal, 1980; 65: 195