论文

TEM精确测定无理择优界面取向

  • 孟杨 ,
  • 谷林 ,
  • 张文征
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  • 1. 清华大学材料科学与工程系先进材料实验室; 北京 100084
    2. Max Planck Institute for Metals Research; Stuttgart D--70569
孟杨, 女, 1982年生, 博士生

收稿日期: 2009-09-04

  修回日期: 2010-01-27

  网络出版日期: 2010-04-11

基金资助

国家自然科学基金项目50671051和高等学校博士学科点专项科

PRECISE DETERMINATION OF THE IRRATIONAL PREFERRED INTERFACE ORIENTATION BY TEM

  • MENG Yang ,
  • GU Lin ,
  • ZHANG Wen-Zheng
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  • 1. Laboratory of Advanced Materials; Department of Materials Science and Engineering; Tsinghua University; Beijing 100084
    2. Max Planck Institute for Metals Research; Stuttgart D–70569

Received date: 2009-09-04

  Revised date: 2010-01-27

  Online published: 2010-04-11

Supported by

Supported by National Natural Science Foundation of China (No.50671051) and Specialized Research Fund for the Doctoral Program of Higher Education (No.20050003005)

摘要

本文介绍了一种应用透射电镜(TEM)的电子衍射菊池花样来精确测量无理择优界面取向的方法. 根据误差分析的结果, 该方法从提高测量精度和增大界面矢量间夹角两方面出发, 分别测量界面迹线和直立(edge-on)取向,计算无理择优界面的取向. 相对其它方法, 该方法将测量误差的影响降到最小, 其计算结果分布集中, 收敛性最好.

本文引用格式

孟杨 , 谷林 , 张文征 . TEM精确测定无理择优界面取向[J]. 金属学报, 2010 , 46(4) : 411 -417 . DOI: 10.3724/SP.J.1037.2009.00577

Abstract

This paper presents a method for precise determination of the orientation of the irrational preferred interface by using TEM. The interface trace and the edge–on orientations are measured careflly and separately to minimize systematic error of thrsults. Tis method was developed according to the error analysis and the fact that te accuracy of the measurement is higher when the measurement is made directly on an interface trace tan on its project on an edge–on orientation, and whn the angle between the trace and the beam direction along the an edge–on orientation is larger. Compard with xisting methods, the present method has minimized the measurement errors and its resuts show better convergence.

参考文献

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