金属学报  1979, Vol. 15 Issue (2): 274-314

论文 本期目录 | 过刊浏览 |

“单颗”微量物质的X射线相分析

吴奇星;覃道湘

大冶钢厂钢铁研究所;大冶钢厂钢铁研究所

"SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY

Wu Qixing;Qin Daoxiong Research Institute of Daye Steet Works

吴奇星;覃道湘. “单颗”微量物质的X射线相分析[J]. 金属学报, 1979, 15(2): 274-314.
, . "SINGLE GRAIN" OSCILLATING CRYSTAL METHOD FOR ULTRAMICROANALYSIS BY X-RAY[J]. Acta Metall Sin, 1979, 15(2): 274-314.

摘要 参考文献 相关文章 Metrics 全文: PDF(1581 KB)   摘要: 采用“单颗”回摆法,在普通的德拜相机中,对重量只有0.003μg的超微量物质进行X射线相分析。 对方法的原理、衍射角的测量及计算、衍射斑点的数目、各个斑点的相对强度与ASTM卡片上同一物质各线条的相对强度间的关系等问题,进行了详细的分析和讨论。 举例说阴这种方法在鉴定稀土夹杂物上的应用,并验证所推导的公式的正确性。 Abstract：X-ray identification of certain superfine grains weighing 0.003μg each hasbeen carried out by means of "single grain" oscillating crystal method in an ordi-nary Debye-Scherrer camera. The principle of this method, the measurement andthe calculation of the diffraction angles, the number of diffraction spots and theirrelative intensities in reference to the relevant ASTM cards are discussed in detail.Attempts have also been made to revealing the presence of certain rare earth inclu-sions by this method as well as to further verifying the proposed formula. 收稿日期: 1979-02-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 吴奇星 覃道湘 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1979/V15/I2/274 [1] Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, 1974, p. 243． [2] Cunningham, B. B., Submicrogram Experimentation, Interscience, New York, 1960, p. 69． [3] 31 (1965) , ?????????p. 148． [4] Guinier,A.,X射线晶体学,施士元译,科学出版社,1959年,p.148． No related articles found! Viewed Full text Abstract Cited   Shared      Discussed