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立方晶系固溶体组分测量的X射线双衍射线法 |
杨传铮;姜小龙 |
中国科学院上海冶金研究所;中国科学院上海冶金研究所 |
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AN X-RAY DOUBLE DIFFRACTION LINE METHOD FOR MEASURING COMPOSITION OF CUBIC CRYSTAL SYSTEM SOLID SOLUTION |
Yang Chuanzheng and Jiang Xiaolong (Shanghai Institute of Metallurgy; Academia Sinica) |
引用本文:
杨传铮;姜小龙. 立方晶系固溶体组分测量的X射线双衍射线法[J]. 金属学报, 1981, 17(2): 196-205.
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AN X-RAY DOUBLE DIFFRACTION LINE METHOD FOR MEASURING COMPOSITION OF CUBIC CRYSTAL SYSTEM SOLID SOLUTION[J]. Acta Metall Sin, 1981, 17(2): 196-205.
[1] Williams, E. W., Cox, R. H., Dobrott, R. D. and Jones, C. E., Electrochem. Technol., 4 (1966) , 479. [2] Popovic, S., J. Appl. Cryst., 4 (1971) , 240. [3] Popovic, S., J. Appl. Cryst., 6 (1973) , 122. [4] #12 |
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