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多族晶面迹线分析方法及其应用 |
李玉清 |
大冶钢厂钢铁研究所;高级工程师;湖北省黄石市(435001) |
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METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION |
LI Yuqing (Research Institute of Daye Steel Works; Huangshi) |
引用本文:
李玉清. 多族晶面迹线分析方法及其应用[J]. 金属学报, 1992, 28(8): 33-41.
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METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION[J]. Acta Metall Sin, 1992, 28(8): 33-41.
1 Hirsch P, Howie A, Nicholson R B, Pashley D W, Whelan M J. Electron Microscopy of Thin Crystals, London: Butterworths, 1971 2 黄孝瑛,透射电子显微学.上海:上海科学技术出版社,1987 3 李玉清.金属学报,1990;26:A177 4 Morniroli J P, Bauer-Grosse E, Gantois M. Philos Mag, 1983; A48: 311 5 李玉清,刘锦岩.金属学报,1986;22:A50 6 李玉清,王慈榕,顾兆丰.金属学报,1992;28:A2259 |
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