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金属学报  1992, Vol. 28 Issue (8): 33-41    
  论文 本期目录 | 过刊浏览 |
多族晶面迹线分析方法及其应用
李玉清
大冶钢厂钢铁研究所;高级工程师;湖北省黄石市(435001)
METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION
LI Yuqing (Research Institute of Daye Steel Works; Huangshi)
引用本文:

李玉清. 多族晶面迹线分析方法及其应用[J]. 金属学报, 1992, 28(8): 33-41.
. METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION[J]. Acta Metall Sin, 1992, 28(8): 33-41.

全文: PDF(2034 KB)  
摘要: 导出了零倾动和非零倾动状态下各种晶系的薄晶中多族晶面迹线夹角的计算公式,并通过实例得到验证.应用这种分析方法可以标定滑移面、孪生面和其它面缺陷的迹线,特别是确定了M_7C_3中同时存在{011}和{013)孪晶等面缺陷。
关键词 多族晶面迹线夹角薄晶倾动    
Abstract:The formula for calculating included angle between polyfamily plane traces in foil of lattice systems under both zero tilt and non-zero tilt states was deduced and verified by certain practical examples. The method may be available to index the plane traces of slip, twin and other defects, especially to determine such plane defects as twin planes of {011} and {013} occurred simultaneously in M_7C_3.
Key wordspolyfamily plane    included trace angle    foil    tilt
收稿日期: 1992-08-18     
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