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Seemann—Bohlin薄膜应力测试方法的修正 |
于利根;白辰东;陈华;徐可为;何家文 |
西安交通大学金属材料及强度研究所;西安710049;西安交通大学;西安交通大学;西安交通大学;西安交通大学 |
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MODIFICATION OF SEEMANN-BOHLIN METHOD FOR STRESS MEASUREMENT |
YU Ligen;BAI Chendong;CHEN Hua;XU Kewei;HE Jiawen Xi'an Jiaotong University Research Institute for strength of Metals;Xi'an Jiaotong University; Xi'an 710049 |
引用本文:
于利根;白辰东;陈华;徐可为;何家文. Seemann—Bohlin薄膜应力测试方法的修正[J]. 金属学报, 1993, 29(4): 91-96.
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MODIFICATION OF SEEMANN-BOHLIN METHOD FOR STRESS MEASUREMENT[J]. Acta Metall Sin, 1993, 29(4): 91-96.
1 Valvoda V, Kuzel R Jr., Cerny R, Rafaja D, Musil J, Kadlec S, Perry A J. Thin Solid Films. 1990; 193/194: 401 2 Haase E L. Thin Solid Films. 1985, 124: 283 3 日本材料学会编.X射线应力测定法.东京:养贤堂,1981 4 西安交通大学材料力学教研室.材料力学.西安:西安交通大学,1984:18 5 于利根.西安交通大学硕士论文,1992 6 Perry A J. Thin Solid Films, 1990; 193/194: 463+ |
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