Fig.3 SEM image of Co0.95Fe0.05Sb3 thin film (a)[49], power factor (S2σ) of Co1 - x Fe x Sb3 (0 ≤ x ≤ 0.1) samples (b)[49], SEM image of CoSb3 + 0.72%Ti thin film (c)[42], schematic illustration of Ti doped CoSb3 thin film growth process ((1) nano Ti layer, (2) CoSb3 growing on the Ti layer, (3) annealed film) (d)[42], various phonon scattering mechanisms by nano-strcucture and Ti based points defect (e)[42], and temperature dependences of Seebeck coefficient (f)[42] and ZT values (g)[42] of the CoSb3 thin films with different Ti contents (Samples with Ti contents of 0, 0.25%, 0.57%, 0.72%, 0.83%, and 1.05% were labeled as S0, S1, S2, S3, S4, and S5, respectively)
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