突破强度-导电率制约关系:晶粒异构设计 |
侯嘉鹏, 孙朋飞, 王强, 张振军, 张哲峰 |
Breaking the Trade-Off Relation Between Strength and Electrical Conductivity: Heterogeneous Grain Design |
HOU Jiapeng, SUN Pengfei, WANG Qiang, ZHANG Zhenjun, ZHANG Zhefeng |
图6 工业纯Al线和工业纯Cu线内晶粒宽度和晶粒长度随拉拔变形量变化规律 |
Fig.6 Evolutions of the grain width and grain length of the commercially pure Al wires (a) and the commercially pure Cu wires (b) related to ε |
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