一种原子尺度应变定义方法及其在识别微观缺陷演化中的应用
盛鹰1,2, 贾彬1,2(), 王汝恒1,2, 陈国平1,2
The Definition of Atomic Scale Strain and Its Application in Identifying the Evolution of Microdefects
SHENG Ying1,2, JIA Bin1,2(), WANG Ruheng1,2, CHEN Guoping1,2

图5. 对应图4中关键点1~6的原子构型图

Fig.5. Atomic configurations of key points 1~6 in Fig.4, respectively
(a) initial state (b) loading process (c) stress flat during the loading process
(d) loading peak (e) unloading process (f) stress flat during the unloading process