Ti70-xTa15Zr15Fex (x=0.3、0.6、1.0)形状记忆合金薄膜的马氏体相变与阻尼行为
郑晓航1, 宁睿1, 段佳彤2, 蔡伟1(
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Martensitic Transformation and Damping Behavior of Ti70-xTa15Zr15Fex (x=0.3, 0.6, 1.0) Shape Memory Thin Films
ZHENG Xiaohang1, NING Rui1, DUAN Jiatong2, CAI Wei1()
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图4. 弯曲法测量的Ti70-xTa15Zr15Fex (x=0.3、0.6、1.0)合金薄膜随温度的变形过程
Fig.4. Transformation processes of Ti70-xTa15Zr15Fex thin films with x=0.3 (a), 0.6 (b) and 1.0 (c) (The measure temperatures from left to righ in the figures are 30 ℃，reverse transformation finish temperature (Af) +30 ℃，30 ℃ (after cooling))
