外延膜的高分辨X射线衍射分析
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李长记 1,邹敏杰 1,2,张磊 1(  ),王元明 1(  ),王甦程 1
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High-Resolution X-Ray Diffraction Analysis of Epitaxial Films
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LI Changji 1,ZOU Minjie 1,2,ZHANG Lei 1(  ),WANG Yuanming 1(  ),WANG Sucheng 1
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图1. SrTiO3单晶的倒易空间与衍射条件示意图
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Fig.1. Schematics of reciprocal space and diffraction condition for the SrTiO3 single crystal (2θ—diffraction angle, —incident vector of X-ray, —diffracted vector of X-ray, —scattering vector)(a) reciprocal lattice points of reflections with [0v0] zone axis for the SrTiO3 single crystal(b) Ewald construction of the symmetric SrTiO3 (002) reflection(c) Ewald constructure of the asymmetric SrTiO3 (103) reflection(d) range in reciprocal space which can be probed by |
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