PHASE-FIELD CRYSTAL SIMULATION ON EVOLU- TION AND GROWTH KINETICS OF KIRKENDALL VOIDS IN INTERFACE AND INTERMETALLIC COMPOUND LAYER IN Sn/Cu SOLDERING SYSTEM
Fig.3. Simulated morphologies of Kirkendall voids at the Cu/Cu3Sn interface and in the Cu3Sn layer at mobilities of MCu=1 and MSn=0.05 (a), 0.01 (b) and 0.005 (c)