图7. 不同固溶处理后初熔区的SEM像(使用的腐蚀液为电解液B)
Fig.7. Low (a~c) and high (d~f) magnified SEM images of IMR in the specimens solution treated at 1210 ℃(a, d), 1230 ℃ (b, e) and 1250 ℃ (c, f) for 2 h and then followed by AC (Specimens were etched with electrolyte B)