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金属学报  1993, Vol. 29 Issue (1): 49-58    
  论文 本期目录 | 过刊浏览 |
纳米粒子粒径评估及测试方法的比较
朱静;蔺锡伟;郭薇;贾丽萍;赵向荣;张晋远;柳春兰;叶恒强;宁小光
洽金工业部钢铁研究总院十三室;教授;北京(100081);冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;冶金工业部钢铁研究总院;中国科学院金属研究所;中国科学院金属研究所
COMPARISON OF METHODS ON EVALUATION AND MEASUREMENT OF NANO-PARTICLES SIZE
ZHU Jing;LIN Xiwei;GUO Wei;JIA Liping;ZHAO Xiangrong;ZHANG Jinyuan;LIU Chunlan;YE Hengqiang;NING Xiaoguang Central Iorn and Steel Research Institute; Ministry of Metallurgical Industry; Beijing Laboratory of Atomic Imaging of Solid; Institute of Metal Research; Academia Sinica; Shengyang
引用本文:

朱静;蔺锡伟;郭薇;贾丽萍;赵向荣;张晋远;柳春兰;叶恒强;宁小光. 纳米粒子粒径评估及测试方法的比较[J]. 金属学报, 1993, 29(1): 49-58.
, , , , , , , , . COMPARISON OF METHODS ON EVALUATION AND MEASUREMENT OF NANO-PARTICLES SIZE[J]. Acta Metall Sin, 1993, 29(1): 49-58.

全文: PDF(2814 KB)  
摘要: 本文介绍了透射电镜综合分析—分散法测定纳米粒子粒径的方法,并将此法与X射线小角散射法及透射电镜暗场法测粒径进行了实验与分析的比较。认为采用X射线小角散射法与透射电镜综合分析—分散法相结合测定评估纳米粒子粒径可以以较快的速度得到准确的结果、综合的信息。
关键词 纳米粒子粒度评估X射线小角散射透射电镜综合分析—分散法暗场技术    
Abstract:Method of TEM compositive anlysis-dispersion for measuring nano-particlesize is reviewed. Comparison of methods between this and of X-ray small angle scattering aswell as of TEM in dark field was carried out by experiments and anlyses. It is believed thatcombination of X-ray small angle scattering and TEM compositive analysis-dispersionmethod is the more rapid, accurate and comprehensive way to evaluate and measure thenano-particle size.
Key wordsnano-particle    particle size    X-ray small angle scattering    TEM compositive analysis-dispersion method    dark field method
收稿日期: 1993-01-18     
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