金属学报  1987, Vol. 23 Issue (2): 223-229

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Al-Mg(Cu)合金钝化膜的XPS深度剖析

王当憨;刘世宏;郭宝兰;朱墨娴;李获

中国科学院化学研究所;中国科学院化学研究所;北京航空学院;北京航空学院;北京航空学院

ANALYSIS OF PASSIVE FILMS OF Al ALLOYS BY XPS DEPTH PROFILE

WANG Danghan; LIU Shihong (Institute of Chemisatry; Academia Sinica; Beijing); GUO Baolan; ZHU Moxian; LI Di (Beijing Institute of Aeronautics and Astronautics)(Manuscript received 4 January; 1985; revised manuscript 10 October; 1985)

王当憨;刘世宏;郭宝兰;朱墨娴;李获. Al-Mg(Cu)合金钝化膜的XPS深度剖析[J]. 金属学报, 1987, 23(2): 223-229.
, , , , . ANALYSIS OF PASSIVE FILMS OF Al ALLOYS BY XPS DEPTH PROFILE[J]. Acta Metall Sin, 1987, 23(2): 223-229.

摘要 参考文献 相关文章 Metrics 全文: PDF(518 KB)   摘要: 本文对一种Al-Mg合金和二种Al-Cu合金的钝化膜进行了深度剖析.结果表明,在三种合金的K_2Cr_O_7钝化膜中,除主要成分Al_2O_3外,还有一定量的Cr_2O_3存于钝化膜中。从而明确地回答了在K_2Cr_2O_7钝化膜中是否有Cr_2O_3,这一长期有争议的问题。在三种合金的8108钝化膜中,除Al_2O_3外,还首先观察到有一定量的金属氮化物和金属络合物.此外,在两种Al-Cu合金的K_2Cr_2O_7和8108钝化膜表面,均未捕获到Cu的信息,Cu被钝化膜覆盖.但有趣的是,两种合金中含量甚低的Mg,由于其氧化迁移富集,结果在两种钝化膜的表面,均给出清晰的Mg原子信息. Abstract：An XPS depth profile analysis was made of the passive films on one Al-Mg alloy and two Al-Cu alloys. It was clarified that in the K_2Cr_2O_7 treated passive films on these alloys, a certain amount of Cr_2O_3 is appeared besides the majority of A1_2O_3. Thus the long-time argument about the presence of Cr_2O_3 in now settled. It was also observed that in the passive films obtained by treatment with N_2-con-taining passivation agent, some A1N and metallic complexes are detected in addition to A1_2O_3. Futhermore, No Cu is signaled in the passive film on two Al-Cu alloys obtained by either K_2Cr_2O_7 or N_2-containing passivation agent, and Cu is shielded by the passive film. It is interesting that a definite Mg peak may be observed on these two passive films although Mg content in Al-Cu alloy is very low, but disappeared after sputtering 5 min. 收稿日期: 1987-02-18      服务 把本文推荐给朋友 加入引用管理器 E-mail Alert RSS 作者相关文章 王当憨 刘世宏 郭宝兰 朱墨娴 李获 44.8K 链接本文: https://www.ams.org.cn/CN/      或      https://www.ams.org.cn/CN/Y1987/V23/I2/223 1 李荻,郭宝兰,朱墨娴,待发表 2 Hofmann S. In: Briggs D, Seah M P. eds. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy. New York: Wiley, 1983, Chapt. 4, 141 3 佘觉觉,王维明,物理,1984;13:92 4 Wagner C D. J Electron Spetrosc Relat Phenom 1983; 32: 99 5 刘友婴,曹家桂,李望,展振宗,真空科学与技术,1984;4:335 6 王当憨,化学试剂 1982;4:175 7 王当憨,刘世宏,赵良仲,分析化学,1984;12:241 8 Shalaby L A, El Sobki K M, Abdul Azim A A. Corros Sci, 1976; 16: 637 9 Samueles B W, Sotoudeh K, Foley R T. Corrosion, 1981; 37: 92 10 Yoshiaki K, Kakeno M, Yamada K et al. J Phys D, 1982; 15: 2067 11 Textor M, Grauer R.Corros Sci, 1983; 23: 41 12 Talati J D, Gandhi U K Corros Sci, 1983; 23: 1315 13 王当憨,郭宝兰,朱墨娴等。中国腐蚀与防护学报,1986;6:49 14 林荣富,戴道宣,江绍猷等,物理学报,1981;30;1295w No related articles found! Viewed Full text Abstract Cited   Shared      Discussed